With the increasing number of block random access memory(BRAM)in large-scale chip,common memory built-in self-test(Mbist)methods have some problems such as low fault coverage,poor flexibility etc.Therefore,in this paper a new Mbist method based on programmable finite state machine is proposed.The method is to integrate eight test algorithms through three counter-driven programmable Mbist control modules and algorithm modules to improve fault coverage and flexibility.The proposed Mbist circuit is designed in Verilog language,and the 1 Kbit×36 BRAM is simulated by Modelsim,and conducted actual testing on an automated testing system.The experimental results show that the method can accurately locate the fault location when testing the BRAM,the fault detection rate is increased by 15.625%,the test efficiency has been improved by 26.1%and the problems of poor flexibility are also greatly improved.